Name | Genes Differentially Expressed in Slow Wilting Phenotypes under a High Vapor Pressure Deficit |
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Description | The purpose of this study is to compare transcriptome profiles of one fast wilting and two slow wilting genotypes under low- and high- vapor pressure deficit Experiments: Five differential expression analyses were performed. 1. Differences within the Hutchesen line for slow and fast wilting; 2. Differences within the PI471938 line for slow and fast wilting; 3. Differences within the PI416937 line for slow and fast wilting; Differences between Hutchesen, PI471938 and PI416937 (regardless of pheotype); 5. Comparison between all lines and all pheotypes Methods: RNASeq data was generated using the Illumina HiSeq. Data passing quality control was processed as follows: Alignment to reference genome Gmax_109 using Tophat2 followed by the Tuxedo pipeline (cufflinks, cuffmerge, cuffdiff). Overall design: Three cultivars, (wild-type Hutchesen and two parentla lines - PI471938 and PI416937; two conditions (normal and slow-wilting); two reps each for a total of 12 samples |
Contact | BCSC, BRC, NC State University |
Xref | PRJNA213009 |
Reference | |
Conditions | 6 |
Species | Glycine max |
Metadata export | .CSV .JSON |
Mapped Genomes | Gm275Wm82a2V1 Gm508Wm82a4V1 |
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Expression Analysis | Expression Profile / Differential Expression / Co-expression |
Name | Genotype | Mutation | Stage | Tissue | Treatment | Level | Time | Samples | Xref | Download alignments |
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Hutchesen_highVPD | Hutchesen | fast wilting | leaf | high vapor pressure |
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Hutchesen_lowVPD | Hutchesen | fast wilting | leaf | low vapor pressure |
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PI416937_highVPD | PI416937 | slow wilting | leaf | high vapor pressure |
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PI416937_lowVPD | PI416937 | slow wilting | leaf | low vapor pressure |
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PI471938_highVPD | PI471938 | slow wilting | leaf | high vapor pressure |
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PI471938_lowVPD | PI471938 | slow wilting | leaf | low vapor pressure |
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